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A Janovec‐Kay‐Dunn‐Like Behavior at Thickness Scaling in Ultra‐Thin Antiferroelectric ZrO 2 Films (Adv. Electron. Mater. 11/2021)

Authors :
Milan Dopita
Sebastian E. Reyes-Lillo
Yasmin Mohamed Yousry
Nujhat Tasneem
Josh Kacher
Asif Islam Khan
Nazanin Bassiri-Gharb
Mengkun Tian
Source :
Advanced Electronic Materials. 7:2170049
Publication Year :
2021
Publisher :
Wiley, 2021.

Details

ISSN :
2199160X
Volume :
7
Database :
OpenAIRE
Journal :
Advanced Electronic Materials
Accession number :
edsair.doi...........0740a6bf900238ccd6675d7fd6760c91