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Automated peak fitting of XPS spectrum using information criteria

Authors :
Kazuhiro Yoshihara
Hiroshi Shinotsuka
Kazuki Nakamura
Hideki Yoshikawa
Ryo Murakami
Hiromi Tanaka
Source :
Journal of Surface Analysis. 26:126-127
Publication Year :
2019
Publisher :
Surface Analysis Society of Japan, 2019.

Subjects

Subjects :
Materials science
X-ray photoelectron spectroscopy
Peak fitting
Information Criteria
Spectrum (topology)
Computational physics

Details

ISSN :
13478400 and 13411756
Volume :
26
Database :
OpenAIRE
Journal :
Journal of Surface Analysis
Accession number :
edsair.doi...........0726a945f543394ea4399fa08180410b
Full Text :
https://doi.org/10.1384/jsa.26.126
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