Erratum: 'Characterization of two-dimensional hexagonal boron nitride using scanning electron and scanning helium ion microscopy' [Appl. Phys. Lett. 104, 031607 (2014)]

Authors :: Jian-Hua Gao
Daisuke Fujita
Hongxuan Guo
Mingsheng Xu
Nobuyuki Ishida
Source :: Applied Physics Letters. 117:049901
Publication Year :: 2020
Publisher :: AIP Publishing, 2020.

Subjects :: Materials science
Physics and Astronomy (miscellaneous)
chemistry
Scanning electron microscope
Analytical chemistry
chemistry.chemical_element
Hexagonal boron nitride
Ion microscopy
Helium
Characterization (materials science)

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