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Very High Resolution Optical Transition Radiation Beam Profile Monitor

Authors :
Tonee Smith
Scott Anderson
D. McCormick
Takashi Naito
Hitoshi Hayano
Josef Frisch
Nobuhiro Terunuma
Bobby McKee
J. Nelson
Keith Jobe
Marc Ross
Source :
AIP Conference Proceedings.
Publication Year :
2002
Publisher :
AIP, 2002.

Abstract

We have constructed and tested a 2 um resolution beam profile monitor based on optical transition radiation (OTR). Theoretical studies of OTR [1] show that extremely high resolution, of the order of the wavelength of the light detected, is possible. Such high‐resolution single pulse profile monitors will be very useful for future free electron laser and linear collider projects. Using the very low emittance 1.3 GeV electron beam at the KEK Accelerator Test Facility (ATF) [2] (1.4nm ex × 15pm ey), we have imaged transition radiation from 5 micron σ beam spots. Our test device consisted of a finely polished target, a thin fused silica window, a 35 mm working distance microscope objective (5x and 10x) and a triggered CCD camera. A wire scanner located near the target is used to verify the profile monitor performance. In this paper we report results of beam tests.

Details

ISSN :
0094243X
Database :
OpenAIRE
Journal :
AIP Conference Proceedings
Accession number :
edsair.doi...........06a36e352fb20d98f514cf7a7f4fbcfe
Full Text :
https://doi.org/10.1063/1.1524406