Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection

MLA

Jung-Suk Goo, et al. “Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection.” 2021 IEEE International Reliability Physics Symposium (IRPS), Mar. 2021. EBSCOhost, https://doi.org/10.1109/irps46558.2021.9405197.

APA

Jung-Suk Goo, N. Pimparkar, Wafa Arfaoui, Robert Tu, Germain Bossu, Steffen Lehmann, A.B. Icel, Pratik B. Vyas, & M. Siddabathula. (2021). Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. 2021 IEEE International Reliability Physics Symposium (IRPS). https://doi.org/10.1109/irps46558.2021.9405197

Chicago

Jung-Suk Goo, N. Pimparkar, Wafa Arfaoui, Robert Tu, Germain Bossu, Steffen Lehmann, A.B. Icel, Pratik B. Vyas, and M. Siddabathula. 2021. “Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection.” 2021 IEEE International Reliability Physics Symposium (IRPS), March. doi:10.1109/irps46558.2021.9405197.