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Scaled performance for submicron GaAs MESFET's
- Source :
- IEEE Electron Device Letters. 6:536-538
- Publication Year :
- 1985
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 1985.
-
Abstract
- Scaling schemes for GaAs MESFET's below the submicron gate length are proposed. The corresponding switching times are calculated accurately down to 0.25µm gate length devices using an ensemble Monte Carlo simulation program. It is demonstrated that the proposed scaled devices offer ultrashort switching time due to the nonstationary carrier transport effects.
- Subjects :
- Materials science
business.industry
Monte Carlo method
Schottky diode
Electronic, Optical and Magnetic Materials
Threshold voltage
Gallium arsenide
Switching time
Computer Science::Hardware Architecture
chemistry.chemical_compound
chemistry
Electronic engineering
Optoelectronics
Field-effect transistor
MESFET
Electrical and Electronic Engineering
business
Scaling
Subjects
Details
- ISSN :
- 07413106
- Volume :
- 6
- Database :
- OpenAIRE
- Journal :
- IEEE Electron Device Letters
- Accession number :
- edsair.doi...........06312d71103ea4d2e06a0b9ed68beba3