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Scaled performance for submicron GaAs MESFET's

Authors :
K. Yokoyama
A. Yoshii
M. Tomizawa
Source :
IEEE Electron Device Letters. 6:536-538
Publication Year :
1985
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 1985.

Abstract

Scaling schemes for GaAs MESFET's below the submicron gate length are proposed. The corresponding switching times are calculated accurately down to 0.25µm gate length devices using an ensemble Monte Carlo simulation program. It is demonstrated that the proposed scaled devices offer ultrashort switching time due to the nonstationary carrier transport effects.

Details

ISSN :
07413106
Volume :
6
Database :
OpenAIRE
Journal :
IEEE Electron Device Letters
Accession number :
edsair.doi...........06312d71103ea4d2e06a0b9ed68beba3