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Measurement of the permittivity and loss tangent of dielectric sheets
- Source :
- Microwave and Optical Technology Letters. 15:355-358
- Publication Year :
- 1997
- Publisher :
- Wiley, 1997.
-
Abstract
- A previously introduced resonant measurement technique is extended to include dielectric sheets. The technique is not limited by the sheet's thickness or dielectric constant because it involves a full-wave analysis of the fixture. A method to account for conduction loss due to the surface resistance of the metal walls of the fixture is presented. Experimental results are presented and compared to previously reported values, and are in excellent agreement. © 1997 John Wiley & Sons, Inc. Microwave Opt Technol Lett 15: 355–358, 1997.
- Subjects :
- Permittivity
Materials science
business.industry
Conduction loss
Electrical engineering
Dielectric
Fixture
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
Dissipation factor
Dielectric loss
Electrical and Electronic Engineering
Composite material
business
Microwave
Sheet resistance
Subjects
Details
- ISSN :
- 10982760 and 08952477
- Volume :
- 15
- Database :
- OpenAIRE
- Journal :
- Microwave and Optical Technology Letters
- Accession number :
- edsair.doi...........05f66953683fcf6966e51d2d75078c6f