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Measurement of the permittivity and loss tangent of dielectric sheets

Authors :
Waymond R. Scott
William R. Humbert
Source :
Microwave and Optical Technology Letters. 15:355-358
Publication Year :
1997
Publisher :
Wiley, 1997.

Abstract

A previously introduced resonant measurement technique is extended to include dielectric sheets. The technique is not limited by the sheet's thickness or dielectric constant because it involves a full-wave analysis of the fixture. A method to account for conduction loss due to the surface resistance of the metal walls of the fixture is presented. Experimental results are presented and compared to previously reported values, and are in excellent agreement. © 1997 John Wiley & Sons, Inc. Microwave Opt Technol Lett 15: 355–358, 1997.

Details

ISSN :
10982760 and 08952477
Volume :
15
Database :
OpenAIRE
Journal :
Microwave and Optical Technology Letters
Accession number :
edsair.doi...........05f66953683fcf6966e51d2d75078c6f