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Reversal of triboelectric charges on sol–gel oxide films annealed at different temperatures

Authors :
Peizhong Feng
Miao Zhang
Yongqiao Zhu
Cheng Xu
Zhong Lin Wang
Shiquan Lin
Wenchao Gao
Dawei Li
Source :
Applied Physics Letters. 118:243902
Publication Year :
2021
Publisher :
AIP Publishing, 2021.

Abstract

Using Kelvin probe force microscopy, we studied the contact-electrification (CE) induced charge density on the surfaces of organic–inorganic composite oxide films, such as Nb2O5, ZrO2, and HfO2 films, prepared by a sol–gel method and annealed at different temperatures. The results show that positive triboelectric charges on the film surface gradually turn into negative ones with the increase in the annealing temperature. This phenomenon is attributed to the broken valence bonds between organics and organic–inorganic composites in the film at high temperature, which causes oxygen vacancy defects and consequently changes the surface states of the film. A surface states model is established to understand the process of CE, which further confirms that electron transfer is the dominant mechanism of CE. Moreover, it indicates that in addition to oxygen vacancies, there are also many other factors that can influence CE, including but not limited to non-stoichiometric ratios, impurities, and other types of defects. These factors will modify the surface states through changing the potential barrier energy of the bound electrons on the surface and thus impact the amount and even the direction of electron transfer.

Details

ISSN :
10773118 and 00036951
Volume :
118
Database :
OpenAIRE
Journal :
Applied Physics Letters
Accession number :
edsair.doi...........0459e0c97cf8d6eac25ce678e78d1d7d
Full Text :
https://doi.org/10.1063/5.0055312