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Generation of X-Rays in the SEM Specimen
- Source :
- Scanning Electron Microscopy and X-ray Microanalysis ISBN: 9781461349693
- Publication Year :
- 2003
- Publisher :
- Springer US, 2003.
-
Abstract
- The electron beam generates x-ray photons in the beam–specimen interaction volume beneath the specimen surface. X-ray photons emerging from the specimen have energies specific to the elements in the specimen; these are the characteristic x-rays that provide the SEM’s analytical capabilities (see Fig. 6.1). Other photons have no relationship to specimen elements and constitute the continuum background of the spectrum. The x-rays we analyze in the SEM usually have energies between 0.1and 20 keV. Our task in this chapter is to understand the physical basis for the features in an x-ray spectrum like that shown in Fig. 6.1.
Details
- ISBN :
- 978-1-4613-4969-3
- ISBNs :
- 9781461349693
- Database :
- OpenAIRE
- Journal :
- Scanning Electron Microscopy and X-ray Microanalysis ISBN: 9781461349693
- Accession number :
- edsair.doi...........0416bc1426e93bfb199f2ebb82fb0bad
- Full Text :
- https://doi.org/10.1007/978-1-4615-0215-9_6