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Generation of X-Rays in the SEM Specimen

Authors :
Joseph I. Goldstein
Joseph R. Michael
Eric Lifshin
Linda Sawyer
Patrick Echlin
Dale E. Newbury
David C. Joy
Charles E. Lyman
Source :
Scanning Electron Microscopy and X-ray Microanalysis ISBN: 9781461349693
Publication Year :
2003
Publisher :
Springer US, 2003.

Abstract

The electron beam generates x-ray photons in the beam–specimen interaction volume beneath the specimen surface. X-ray photons emerging from the specimen have energies specific to the elements in the specimen; these are the characteristic x-rays that provide the SEM’s analytical capabilities (see Fig. 6.1). Other photons have no relationship to specimen elements and constitute the continuum background of the spectrum. The x-rays we analyze in the SEM usually have energies between 0.1and 20 keV. Our task in this chapter is to understand the physical basis for the features in an x-ray spectrum like that shown in Fig. 6.1.

Details

ISBN :
978-1-4613-4969-3
ISBNs :
9781461349693
Database :
OpenAIRE
Journal :
Scanning Electron Microscopy and X-ray Microanalysis ISBN: 9781461349693
Accession number :
edsair.doi...........0416bc1426e93bfb199f2ebb82fb0bad
Full Text :
https://doi.org/10.1007/978-1-4615-0215-9_6