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High-resolution electron microscopy of surfaces: Profile views and front views
- Source :
- Proceedings, annual meeting, Electron Microscopy Society of America. 44:384-387
- Publication Year :
- 1986
- Publisher :
- Cambridge University Press (CUP), 1986.
-
Abstract
- High resolution electron microscopy images of crystals are obtained by making some beams, diffracted by the crystal, interfere with the transmitted beam. For some experimental conditions, to be carefully defined for each specimen, the image can be shown to represent atomic columns; thus information in the atomic range is obtained, though it must be stressed that interpretation of these structure images must be done carefully as artefacts can give effects not linked with the crystal structure. In the last 3 years, this technique has been applied to the study of surfaces where it has given some striking results.
- Subjects :
- 0303 health sciences
03 medical and health sciences
Materials science
High resolution electron microscopy
Optics
business.industry
020209 energy
0202 electrical engineering, electronic engineering, information engineering
02 engineering and technology
General Medicine
business
030304 developmental biology
Front (military)
Subjects
Details
- ISSN :
- 26901315 and 04248201
- Volume :
- 44
- Database :
- OpenAIRE
- Journal :
- Proceedings, annual meeting, Electron Microscopy Society of America
- Accession number :
- edsair.doi...........0359a7ed23ee34f0f29ece4a0195aba2