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Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM

Authors :
Jiashi Miao
Lee Casalena
Thomas C. Pekin
Maryam Ghazisaeidi
J. Ciston
Michael J. Mills
Source :
Microscopy and Microanalysis. 25:1834-1835
Publication Year :
2019
Publisher :
Oxford University Press (OUP), 2019.

Subjects

Subjects :
Materials science
Microstructure
Instrumentation
Biomedical engineering
Characterization (materials science)

Details

ISSN :
14358115 and 14319276
Volume :
25
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........034c12dcc5a51f859d37acda73fa069a
Full Text :
https://doi.org/10.1017/s1431927619009905
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