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Multi-class classifier-independent feature analysis

Authors :
Hilary J. Holz
Murray H. Loew
Source :
Pattern Recognition Letters. 18:1219-1224
Publication Year :
1997
Publisher :
Elsevier BV, 1997.

Abstract

In ( Holz and Loew, 1994a , Holz and Loew, 1994b ), we presented a metric for use in classifier-independent feature analysis called relative feature importance (RFI). RFI was shown to correctly rank features on a variety of two-class multi-cluster, mixed-distribution problems, including problems that cannot be solved using the marginal distributions of the features. We present here a complete design for RFI, including new results on parameter settings and calculation details determined on two-class problems. We then show that, using the design arising from exploration of two-class problems, RFI extends naturally and successfully to multi-class problems.

Details

ISSN :
01678655
Volume :
18
Database :
OpenAIRE
Journal :
Pattern Recognition Letters
Accession number :
edsair.doi...........02fcaeafef43d0c394b6f744a67a95bc