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Multi-class classifier-independent feature analysis
- Source :
- Pattern Recognition Letters. 18:1219-1224
- Publication Year :
- 1997
- Publisher :
- Elsevier BV, 1997.
-
Abstract
- In ( Holz and Loew, 1994a , Holz and Loew, 1994b ), we presented a metric for use in classifier-independent feature analysis called relative feature importance (RFI). RFI was shown to correctly rank features on a variety of two-class multi-cluster, mixed-distribution problems, including problems that cannot be solved using the marginal distributions of the features. We present here a complete design for RFI, including new results on parameter settings and calculation details determined on two-class problems. We then show that, using the design arising from exploration of two-class problems, RFI extends naturally and successfully to multi-class problems.
Details
- ISSN :
- 01678655
- Volume :
- 18
- Database :
- OpenAIRE
- Journal :
- Pattern Recognition Letters
- Accession number :
- edsair.doi...........02fcaeafef43d0c394b6f744a67a95bc