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Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence

Authors :
George D. W. Swerhone
Martin Obst
Tolek Tyliszczak
John R. Lawrence
Adam P. Hitchcock
Source :
Microscopy and Microanalysis. 16:924-925
Publication Year :
2010
Publisher :
Oxford University Press (OUP), 2010.

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Subjects

Subjects :
Soft x ray
Low energy
Materials science
Analytical chemistry
X-ray fluorescence
Sensitivity (control systems)
Instrumentation

Details

ISSN :
14358115 and 14319276
Volume :
16
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........02a3ae8f38022527b25756b0f542d835
Full Text :
https://doi.org/10.1017/s1431927610054899
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