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High mass and spatial resolution mass spectrometry imaging of Nicolas Poussin painting cross section by cluster TOF-SIMS
- Source :
- Journal of Mass Spectrometry. 51:1196-1210
- Publication Year :
- 2016
- Publisher :
- Wiley, 2016.
- Subjects :
- Painting
business.industry
Chemistry
010401 analytical chemistry
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
Mass spectrometry imaging
0104 chemical sciences
Cross section (physics)
Optics
Cluster (physics)
High mass
0210 nano-technology
business
Image resolution
Spectroscopy
Subjects
Details
- ISSN :
- 10765174
- Volume :
- 51
- Database :
- OpenAIRE
- Journal :
- Journal of Mass Spectrometry
- Accession number :
- edsair.doi...........02970f5645127c2a83b7196bcb144613
- Full Text :
- https://doi.org/10.1002/jms.3885