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An Information Leakage Sensor Based on Measurement of Laser-Induced Opto-Electric Bulk Current Density

Authors :
Kazuo Ohta
Yang Li
Mitsugu Iwamoto
Sho Tada
Makoto Nagata
T. Sugawara
N. Miura
K. Matsuda
Kazuo Sakiyama
Source :
Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials.
Publication Year :
2019
Publisher :
The Japan Society of Applied Physics, 2019.

Subjects

Subjects :
Materials science
law
business.industry
Information leakage
Optoelectronics
Laser
business
Current density
law.invention

Details

Database :
OpenAIRE
Journal :
Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials
Accession number :
edsair.doi...........023dc2a0bdebe63ae95c8382cc650670
Full Text :
https://doi.org/10.7567/ssdm.2019.m-1-03
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