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High-precision determination of Si-neutron coherent scattering length with a dual non-dispersive sample
- Source :
- AIP Conference Proceedings.
- Publication Year :
- 2012
- Publisher :
- AIP, 2012.
-
Abstract
- We report here our new interferometric measurements of neutron coherent scattering length bC for silicon using a better polished dual non-dispersive sample. We have measured a large and exactly non-dispersive phase by this method to within 1 part in 106 and determined the silicon bC to within a few parts in 105.
Details
- ISSN :
- 0094243X
- Database :
- OpenAIRE
- Journal :
- AIP Conference Proceedings
- Accession number :
- edsair.doi...........01bdcee9a68ae0707c917b7b0525416f