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Comparison of optimal accelerated life tests with competing risks model under exponential distribution

Authors :
Yi Fu Wang
Tsai Hung Fan
Source :
Quality and Reliability Engineering International. 37:902-919
Publication Year :
2020
Publisher :
Wiley, 2020.

Details

ISSN :
10991638 and 07488017
Volume :
37
Database :
OpenAIRE
Journal :
Quality and Reliability Engineering International
Accession number :
edsair.doi...........01320906b30e026733d9b1211af12a48
Full Text :
https://doi.org/10.1002/qre.2772