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EFFECT OF SILICON AFM PROBE LOCATION ON ABSORPTION PROFILE OF GOLD NANO-STRUCTURES ON A DIELECTRIC SURFACE

Authors :
M. Pinar Mengüç
Hakan Erturk
Sina Talebi Moghaddam
Source :
Proceeding of Proceedings of the 8th International Symposium on Radiative Transfer, RAD-16 June 6-10,2016, Cappadocia, Turkey.
Publication Year :
2016
Publisher :
Begellhouse, 2016.

Subjects

Subjects :
Materials science
Silicon
chemistry
Atomic force microscopy
Probe location
Nano
Analytical chemistry
chemistry.chemical_element
Absorption (electromagnetic radiation)
Dielectric surface

Details

Database :
OpenAIRE
Journal :
Proceeding of Proceedings of the 8th International Symposium on Radiative Transfer, RAD-16 June 6-10,2016, Cappadocia, Turkey
Accession number :
edsair.doi...........00b484ba59c425c82e65aa825b9f56b5
Full Text :
https://doi.org/10.1615/rad-16.50
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