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DEFECT CHARACTERIZATION IN MOCVD INP/GAINAS/INP LAYERS

Authors :
Jin, N
Booker, G
Blunt, R
Source :
MICROSCOPY OF SEMICONDUCTING MATERIALS 1993 8th Royal-Microscopical-Society Conference: Microscopy of Semiconducting Materials 1993 (MSM VIII). (134)
Publication Year :
1993

Details

ISSN :
09513248
Issue :
134
Database :
OpenAIRE
Journal :
MICROSCOPY OF SEMICONDUCTING MATERIALS 1993 8th Royal-Microscopical-Society Conference: Microscopy of Semiconducting Materials 1993 (MSM VIII)
Accession number :
edsair.dedup.wf.001..faec23362cc9bad6850b39faf5f5724b

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