Comparison of Quadrupole Scan and Multi-screen Method for the Measurement of Projected and Slice Emittance at the SwissFEL Injector Test Facility

High-brightness electron bunches with small transverse emittance are required to drive X-ray free-electron lasers (FELs). For the measurement of the transverse emittance, the quadrupole scan and multi-screen methods are the two most common procedures. By employing a transverse deflecting structure, the measurement of the slice emittance becomes feasible. The quadrupole scan is more flexible in freely choosing the data points during the scan, while the multi-screen method allows on-line emittance measurements utilising off-axis screens in combination with fast kicker magnets. The latter is especially the case for high-repetition multi-bunch FELs, such as the European XFEL, which offer the possibility of on-line diagnostics. In this paper, we present comparative measurements of projected and slice emittance applying these two methods at the SwissFEL Injector Test Facility and discuss the implementation of on-line diagnostics at the European XFEL.