[Invited] Scanning tunnelling microscopy and angle-resolved photoelectron spectroscopy studies of graphene on SiC (C-face) substrate grown by Si flux-assisted molecular beam epitaxy

Authors :: RAZADO-COLAMBO, I.
Nys, J.P.
Wallart, X.
Moreau, E.
Godey, S.
Avila, J.
Asensio, M.C.
Vignaud, D.
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN)
Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
Source :: PDI Topical Workshop on MBE-Grown Graphene, PDI Topical Workshop on MBE-Grown Graphene, 2013, Berlin, Germany
Publication Year :: 2013
Publisher :: HAL CCSD, 2013.

Language :: English
Database :: OpenAIRE
Journal :: PDI Topical Workshop on MBE-Grown Graphene, PDI Topical Workshop on MBE-Grown Graphene, 2013, Berlin, Germany
Accession number :: edsair.dedup.wf.001..f0f236939441f7818b7b3e2835fa4249

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