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Scaling of GaN HEMTs Thermal Transient Characteristics
- Source :
- The compound semiconductor week (CSW), The compound semiconductor week (CSW), May 2018, Boston, United States
- Publication Year :
- 2018
- Publisher :
- HAL CCSD, 2018.
-
Abstract
- International audience
- Subjects :
- [SPI]Engineering Sciences [physics]
ComputingMilieux_MISCELLANEOUS
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- The compound semiconductor week (CSW), The compound semiconductor week (CSW), May 2018, Boston, United States
- Accession number :
- edsair.dedup.wf.001..da829493cfa0cca51a45d3e56c7cf5fc