Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : quantitative charge measurements and dipole-dipole interactions

Authors :: Melin, Thierry
Diesinger, H.
Deresmes, D.
Stiévenard, D.
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN)
Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
Source :: 12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands
Publication Year :: 2003
Publisher :: HAL CCSD, 2003.

Language :: English
Database :: OpenAIRE
Journal :: 12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands
Accession number :: edsair.dedup.wf.001..c94bd05532a890e1a7854204fbaa2a01

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