A method for on-wafer experimental characterization of a 4-port circuit, using a 2-port vector network analyzer

Authors :: Stefan Simion
Marcelli, R.
Sajin, G.
Bartolucci, G.
Craciunoiu, F.
Source :: Scopus-Elsevier, Romanian Journal of Information Science and Technology 12 (2009): 394–401., info:cnr-pdr/source/autori:Simion S, Marcelli R, Sajin G, Bartolucci G, Craciounoiu F/titolo:A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyze/doi:/rivista:Romanian Journal of Information Science and Technology/anno:2009/pagina_da:394/pagina_a:401/intervallo_pagine:394–401/volume:12
Abstract: The paper presents an experimental method useful to characterize on-wafer a four-port circuit, using a two-port VNA (V ector Network A nalyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.

Subjects :: CRLH coupler
On-wafer measurement
Scattering matrices
Vector network analyzer
Settore ING-INF/01 - Elettronica

Database :: OpenAIRE
Journal :: Scopus-Elsevier, Romanian Journal of Information Science and Technology 12 (2009): 394–401., info:cnr-pdr/source/autori:Simion S, Marcelli R, Sajin G, Bartolucci G, Craciounoiu F/titolo:A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyze/doi:/rivista:Romanian Journal of Information Science and Technology/anno:2009/pagina_da:394/pagina_a:401/intervallo_pagine:394–401/volume:12
Accession number :: edsair.dedup.wf.001..9db033939bee4287d03775a2eebcbfe4

Tools