Back to Search Start Over

Best practice approaches for stress measurements on thin layer stacks

Authors :
Auerswald, E.
Vogel, D.
Marco SEBASTIANI
Lord, J.
Rzepka, S.
E. Auerswald, D. Vogel, M. Sebastiani, J. Lord, S. Rzepka
Auerswald, E.
Vogel, D.
Sebastiani, Marco
Lord, J.
Rzepka, S.
Source :
Scopus-Elsevier

Abstract

As illustrated for single cases, the residual stress analysis based on FIB milling and DIC analysis has a large potential to determine residual stresses in thin layer systems. For the introduction of the FIB-DIC approach as industrial method, measurement automation with time saving fast measurement routines, cost efficient and validated measurement procedures are a basic prerequisite. A best practice report under preparation (in [6]) will give the industrial user guidance to implement and use the FIBDIC method with own equipment. Besides instructions to get started fast, a wide experience in applying the FIB-DIC method will be presented. It allows preparation of suitable measurement routines for customer specific problems, avoiding elaborate trial-and-error tests.

Details

Database :
OpenAIRE
Journal :
Scopus-Elsevier
Accession number :
edsair.dedup.wf.001..88a77e694ec1c3fbeee9f3acec7192ec