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Best practice approaches for stress measurements on thin layer stacks
- Source :
- Scopus-Elsevier
-
Abstract
- As illustrated for single cases, the residual stress analysis based on FIB milling and DIC analysis has a large potential to determine residual stresses in thin layer systems. For the introduction of the FIB-DIC approach as industrial method, measurement automation with time saving fast measurement routines, cost efficient and validated measurement procedures are a basic prerequisite. A best practice report under preparation (in [6]) will give the industrial user guidance to implement and use the FIBDIC method with own equipment. Besides instructions to get started fast, a wide experience in applying the FIB-DIC method will be presented. It allows preparation of suitable measurement routines for customer specific problems, avoiding elaborate trial-and-error tests.
Details
- Database :
- OpenAIRE
- Journal :
- Scopus-Elsevier
- Accession number :
- edsair.dedup.wf.001..88a77e694ec1c3fbeee9f3acec7192ec