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Characterization of R.F. sputtered vanadium oxide thin films and intercalation of lithium in the oxide films
- Source :
- Electrochemistry, Electrochemistry, 2004, pp.72 (2004) 261-265, Electrochemistry, 2004, 72, pp.261
- Publication Year :
- 2004
- Publisher :
- HAL CCSD, 2004.
-
Abstract
- International audience
- Subjects :
- [CHIM.MATE] Chemical Sciences/Material chemistry
[CHIM.MATE]Chemical Sciences/Material chemistry
[PHYS.PHYS.PHYS-CHEM-PH]Physics [physics]/Physics [physics]/Chemical Physics [physics.chem-ph]
ComputingMilieux_MISCELLANEOUS
[PHYS.PHYS.PHYS-CHEM-PH] Physics [physics]/Physics [physics]/Chemical Physics [physics.chem-ph]
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Electrochemistry, Electrochemistry, 2004, pp.72 (2004) 261-265, Electrochemistry, 2004, 72, pp.261
- Accession number :
- edsair.dedup.wf.001..6eb2374ac6fe3811dbecd129ff1809c1