Improved extraction of effective electric field and hole mobility in Ge and GeOI MOSFETs

Authors :: Den Daele, W.
Le Royer, C.
Mitard, J.
gerard ghibaudo
Cristoloveanu, S.
Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC)
Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)
Domenget, Chahla
Source :: 6th EUROSOI Workshop, 6th EUROSOI Workshop, Jan 2010, Grenoble, France, HAL
Publication Year :: 2010
Publisher :: HAL CCSD, 2010.
Abstract: National audience

Subjects :: [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
ComputingMilieux_MISCELLANEOUS

Language :: English
Database :: OpenAIRE
Journal :: 6th EUROSOI Workshop, 6th EUROSOI Workshop, Jan 2010, Grenoble, France, HAL
Accession number :: edsair.dedup.wf.001..6e188463780ad75466ba9182a67546ef

Tools