Surface structure characterization of a (root 5 x root 5)-R26.6 degrees reconstruction of strontium titanate (001) by X-ray photoelectron diffraction

Agradecimentos: This work was supported by the Brazilian research agencies Fundação de Amparo à Pesquisa do Estado de São Paulo - FAPESP (proposals 2017/18574-4 and 2017/25983-8), Conselho Nacional de Desenvolvimento Científico e Tecnológico - CNPq (Grants 310774/2020-9 (AP), 304119/2019-9 (AS), and 302450/2017-3 (PAPN), and CNPEM/LNLS Abstract: The surface composition of a (root 5 x root 5)-R26.6 degrees (Rt5) reconstruction of a strontium titanate (001) single crystal surface was characterized by X-ray photoelectron spectroscopy (XPS), and its atomic surface structure was determined by a combination of low energy electron diffraction (LEED) and X-ray photoelectron diffraction (XPD). The comparison between experimental and theoretical XPD results involving multiple scattering calculations indicated that the analyzed Rt5 reconstruction of the SrTiO3 (001) surface has two possible terminations: 40% of SrO and 60% of TiO2 FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESP CONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICO - CNPQ Fechado