A generic deep-learning based defect segmentation model for electron micrographs for automatic defect inspection

MLA

Julien Baderot, et al. A Generic Deep-Learning Based Defect Segmentation Model for Electron Micrographs for Automatic Defect Inspection. Jan. 2023. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.dedup.wf.001..678900a818b01e154766d1b9cd62a9fa&authtype=sso&custid=ns315887.

APA

Julien Baderot, Ali Hallal, Martin Jacob, Vincent Barra, Arnaud Guillin, Sergio Martinez, & Johann Foucher. (2023). A generic deep-learning based defect segmentation model for electron micrographs for automatic defect inspection.

Chicago

Julien Baderot, Ali Hallal, Martin Jacob, Vincent Barra, Arnaud Guillin, Sergio Martinez, and Johann Foucher. 2023. “A Generic Deep-Learning Based Defect Segmentation Model for Electron Micrographs for Automatic Defect Inspection,” January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.dedup.wf.001..678900a818b01e154766d1b9cd62a9fa&authtype=sso&custid=ns315887.