Image processing of 2D resistivity data to locate precisely faults

MLA

Nguyen, F., et al. Image Processing of 2D Resistivity Data to Locate Precisely Faults. Jan. 2005. EBSCOhost, https://doi.org/10.1016/j.jappgeo.2005.02.001⟩.

APA

Nguyen, F., Garambois, S., Jongmans, D., Pirard, E., & Locke, M. (2005). Image processing of 2D resistivity data to locate precisely faults. https://doi.org/10.1016/j.jappgeo.2005.02.001⟩

Chicago

Nguyen, F., Stéphane Garambois, Denis Jongmans, E. Pirard, and M. Locke. 2005. “Image Processing of 2D Resistivity Data to Locate Precisely Faults,” January. doi:10.1016/j.jappgeo.2005.02.001⟩.