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Reliable evaluation of dislocation densities in GaN epilayers by molten KOH etching

Authors :
Gao, Z. -Y
Hao, Y.
Zhang, J. -C
Zhang, J. -F
jinyu ni
Source :
Scopus-Elsevier

Details

Database :
OpenAIRE
Journal :
Scopus-Elsevier
Accession number :
edsair.dedup.wf.001..61cc7de5647a27fa442547285a5542ef

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