Monitoring chemical composition and band gap at a sub-nanometer scale using valence electron scattering response in a high resolution FEG-TEM

Authors :: Cheynet, M.C.
Pokrant, S.
Tichelaar, F. D.
Science et Ingénierie des Matériaux et Procédés (SIMaP)
Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Source :: Monitoring chemical composition and band gap at a sub-nanometer scale using valence electron scattering response in a high resolution FEG-TEM, International Microscopy Conference IMC-16, International Microscopy Conference IMC-16, 2006, Sapporo, Japan. a paraitre
Publication Year :: 2006
Publisher :: HAL CCSD, 2006.

Subjects :: [SPI.GPROC]Engineering Sciences [physics]/Chemical and Process Engineering
[CHIM.MATE]Chemical Sciences/Material chemistry

Language :: English
Database :: OpenAIRE
Journal :: Monitoring chemical composition and band gap at a sub-nanometer scale using valence electron scattering response in a high resolution FEG-TEM, International Microscopy Conference IMC-16, International Microscopy Conference IMC-16, 2006, Sapporo, Japan. a paraitre
Accession number :: edsair.dedup.wf.001..6155034f2d63f10449d11e43c430d3d7

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