3D Analysis of Thin Layers by ToF-SIMS

Authors :: Mikko Utriainen
Puurunen, Riikka L.
Alireza, M. Kia
Sajjad Esmaeli
Clemens Mart
Nora Haufe
Wenke Weinreich
Source :: VTT Technical Research Centre of Finland-PURE, Utriainen, M, Puurunen, R L, Kia, A M, Esmaeli, S, Mart, C, Haufe, N & Weinreich, W 2018, ' 3D Analysis of Thin Layers by ToF-SIMS ', 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry-Micro-and nanoscale characterization, Dresden, Germany, 31/01/19-31/01/19 .

Database :: OpenAIRE
Journal :: VTT Technical Research Centre of Finland-PURE, Utriainen, M, Puurunen, R L, Kia, A M, Esmaeli, S, Mart, C, Haufe, N & Weinreich, W 2018, ' 3D Analysis of Thin Layers by ToF-SIMS ', 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry-Micro-and nanoscale characterization, Dresden, Germany, 31/01/19-31/01/19 .
Accession number :: edsair.dedup.wf.001..5cabec64bb7f3acd978f8680b00756ab

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