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Experimental determination of inelastic scattering cross-sections of Si, Ge and III-V semiconductors 2003

Authors :
Orosz, G. T.
Gergely, G.
Gurban, S.
Menyhard, M.
Toth, J.
Varga, D.
Sven Tougaard
Source :
Orosz, G T, Gergely, G, Gurban, S, Menyhard, M, Toth, J, Varga, D & Tougaard, S 2003, ' Experimental determination of inelastic scattering cross-sections of Si, Ge and III-V semiconductors 2003 ', Zhenkong, vol. 71, pp. 147-152 ., University of Southern Denmark
Publication Year :
2003

Details

Language :
English
Database :
OpenAIRE
Journal :
Orosz, G T, Gergely, G, Gurban, S, Menyhard, M, Toth, J, Varga, D & Tougaard, S 2003, ' Experimental determination of inelastic scattering cross-sections of Si, Ge and III-V semiconductors 2003 ', Zhenkong, vol. 71, pp. 147-152 ., University of Southern Denmark
Accession number :
edsair.dedup.wf.001..598282eb202f35bab85fd4ed313c80e1