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Sealing of porous low-k dielectric materials: UV-O3 oxidised CVD silicon oxycarbide films

Authors :
Whelan, C. M.
Cecchet, F.
Le, Q. C.
Satta, A.
Pireaux, J. J.
Maex, K.
Petra Rudolf
Rijksuniversiteit Groningen
Source :
Physicalia Magazine, 24, 201-210, University of Groningen
Publication Year :
2002

Details

Language :
Dutch; Flemish
Database :
OpenAIRE
Journal :
Physicalia Magazine, 24, 201-210, University of Groningen
Accession number :
edsair.dedup.wf.001..4ff52046e8c869579eb9235012a3400f