Unified Soft Breakdown MOSFETs Compact Model: From Experiments to Circuit Simulation

Authors :: Gerrer, L.
Rafik, M.
Ribes, G.
gerard ghibaudo
Domenget, Chahla
Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC)
Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)
Source :: 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2010, 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2010, 2010, Monte CassinO, Italy, HAL
Publication Year :: 2010
Publisher :: HAL CCSD, 2010.
Abstract: International audience

Subjects :: [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
ComputingMilieux_MISCELLANEOUS

Language :: English
Database :: OpenAIRE
Journal :: 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2010, 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2010, 2010, Monte CassinO, Italy, HAL
Accession number :: edsair.dedup.wf.001..4893e1589b08feee52e1ef781519641b

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