Cite
Compact modeling of gate tunneling leakage current in advanced nanoscale soi mosfets
MLA
Darbandy, Ghader. Compact Modeling of Gate Tunneling Leakage Current in Advanced Nanoscale Soi Mosfets. Dec. 2012. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.dedup.wf.001..45ad3e0de1e6c68bd12044c9aaa94d15&authtype=sso&custid=ns315887.
APA
Darbandy, G. (2012). Compact modeling of gate tunneling leakage current in advanced nanoscale soi mosfets.
Chicago
Darbandy, Ghader. 2012. “Compact Modeling of Gate Tunneling Leakage Current in Advanced Nanoscale Soi Mosfets,” December. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.dedup.wf.001..45ad3e0de1e6c68bd12044c9aaa94d15&authtype=sso&custid=ns315887.