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Structural Characterization of InAs/GaAs and InAs/InP Quantum Dots by Transmission Electron Microscopy

Authors :
Mccaffrey, J. P.
Robertson, M. D.
Poole, P.
Zbigniew Roman Wasilewski
Riel, B.
Williams, R.
Fafard, S.
Source :
Scopus-Elsevier
Publication Year :
2009

Abstract

Materials Research Society Symposium, 2001

Details

Database :
OpenAIRE
Journal :
Scopus-Elsevier
Accession number :
edsair.dedup.wf.001..4598da140da6f5a06cdb01e0e4b82815

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