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Structural and morphological characterization of silicophosphate thin films containing Nd 3+ ions

Authors :
Elisa, M.
Ileana Cristina Vasiliu
Sava, B. A.
Nastase, F.
Nastase, C.
Volceanov, A.
Dima, V.
Stoleriu, S.
Eftimie, M.
Source :
Scopus-Elsevier

Details

Database :
OpenAIRE
Journal :
Scopus-Elsevier
Accession number :
edsair.dedup.wf.001..36a9524bd57e80468312eeba32b55260

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