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AFM and ellipsometry combined for nanoscale imaging

Authors :
Memesa, M.
Cumurcu, A.
Schön, P.M.
Vancso, G.J.
Materials Science and Technology of Polymers
Source :
DPI Annual Meeting 2010, MESA+ Meeting 2010
Publication Year :
2010

Subjects

Subjects :
METIS-272616

Details

Language :
English
Database :
OpenAIRE
Journal :
DPI Annual Meeting 2010, MESA+ Meeting 2010
Accession number :
edsair.dedup.wf.001..365499e8b31e892c1e70df4a8d890abc

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Authors Abstract Subjects Details