Skip to search
Skip to main content
About Us
Vision
Our Story
Technology
Focus Areas
Our Team
Access
Policies
Guides
Events
COVID-19 Advisory
Collections
Books & Journals
A-Z listing
Special Collections
Contact Us
Jio Institute Digital Library
Searchworks
Searchworks
Select search scope, currently:
Articles
Catalog
books, media & more in Jio Institute collections
Articles
journal articles & other e-resources
Search
All Fields
Eds Title
Eds Authors
Eds Subjects
search for
Search
Help
Bookmarks
0
Search history
Sign in
Back to Search
Start Over
Development of a new analysis method in two-dimensional reciprocal space map and evaluation of surface atomic arrangement in three-dimensionally nano-fabricated materials using diffraction
Authors :
Shouhei, Takemoto
Publication Year :
2018
Publisher :
奈良先端科学技術大学院大学, 2018.
Subjects
Subjects :
回折法
X線回折
電子線回折
逆格子
Details
Language :
English
Database :
OpenAIRE
Accession number :
edsair.dedup.wf.001..31481f4dede28ab0c3e4b4eff51d1d2b
Tools
Email
Cite
Printer
Authors
Abstract
Subjects
Details