Back to Search Start Over

Hall effect study of the κ -(ET) 2X family : Evidence for Mott-Anderson localization

Authors :
Čulo, Matija
Tafra, Emil
Mihaljević, Branimir
Basletić, Mario
Kuveždić, Marko
Ivek, Tomislav
Hamzić, Amir
Tomić, Silvia
Hiramatsu, T.
Yoshida, Y.
Saito, G.
Schlueter, J.A.
Dressel, M.
Korin-Hamzić, Bojana
Source :
Physical Review B, Volume 99, Issue 4
Publication Year :
2019

Abstract

We investigate the dc resistivity and Hall effect of the quasi-two-dimensional organic materials κ–(ET)2X, where X=Ag2(CN)3 and B(CN)4 and compare them with the results for X=Cu2(CN)3. All three compounds are considered to be quantum-spin-disordered Mott insulators. Despite high similarities in chemical composition and crystal structure, large differences in the dc resistivity and Hall coefficient are found. While around room temperature the dc transport properties are dominantly determined by the strength of the electron correlations, upon reducing the temperature, dc transport happens by hopping due to inherent disorder. The most disordered compound with X=Cu2(CN)3 turns out to have the lowest dc resistivity and the highest charge carrier density, i.e., in the phase diagram it is located closest to the metal-insulator transition. The least disordered compound with X=B(CN)4 shows the highest resistivity and the lowest carrier density, i.e., lies farthest from the metal-insulator transition. We explain such counterintuitive behavior within the theory of Mott-Anderson localization as a consequence of disorder-induced localized states within the correlation gap.

Details

Language :
English
ISSN :
24699950 and 24699969
Database :
OpenAIRE
Journal :
Physical Review B, Volume 99, Issue 4
Accession number :
edsair.dedup.wf.001..298efbfc2c246c633776b6654e8435e8
Full Text :
https://doi.org/10.1103/PhysRevB.99.045114