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X-ray photoelectron spectroscopy evaluation on surface chemical states of GaN, InGaN and AIGaN heteroepitaxial thin films grown on sapphire by MOCVD

Authors :
Li, K.
Andrew Wee
Lin, J.
Feng, Zc
Chua, Sj
Source :
Scopus-Elsevier, ResearcherID

Details

Database :
OpenAIRE
Journal :
Scopus-Elsevier, ResearcherID
Accession number :
edsair.dedup.wf.001..20d0cec5947c73b463b02ee6debff347

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