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Integration of functional oxides on silicon for nanoelectronics and energy

Details

Language :
English
Database :
OpenAIRE
Journal :
International Conference on Materials and Characterization Techniques (ICMCT), International Conference on Materials and Characterization Techniques (ICMCT), 2014, VIT Univ., Vellore, Chennai, India
Accession number :
edsair.dedup.wf.001..1d9289d8d2bbe0258d695481083e11ff