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Small angle X-ray scattering study of TiO2 thin films at grazing angles
- Publication Year :
- 1998
-
Abstract
- Nanocrystalline TiO2 thin films, deposited on the flat glass substrate using various techniques, have been investigated by GISAXS. In data interpretation it is assumed that the surface roughness correspond to the bulk structure of the film, which is porous. Therefore, both contributions should indicate the same average particle sizes and film porosity. So obtained film parameters are correlated to photo cell efficiency.
- Subjects :
- thin films
GISAXS
porosity
particle size
photo cell
SAXS
TiO2
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Accession number :
- edsair.dedup.wf.001..042aec9e604155f2f06c0a16c5f9ba06