Investigation of Structural Features of Porous Silicon Multilayers by Means of GISAXS Measurements

Authors :: Angeloni M
Moretti L
Mocella V
De Stefano L
Rotiroti L
Rea I
Dardano P
Bernstorff S
Source :: International workshop on Nanostructured Materials, Antalya, 2006, info:cnr-pdr/source/autori:Angeloni M, Moretti L, Mocella V, De Stefano L, Rotiroti L, Rea I, Dardano P, Bernstorff S/congresso_nome:International workshop on Nanostructured Materials/congresso_luogo:Antalya/congresso_data:2006/anno:2006/pagina_da:/pagina_a:/intervallo_pagine
Publication Year :: 2006

Database :: OpenAIRE
Journal :: International workshop on Nanostructured Materials, Antalya, 2006, info:cnr-pdr/source/autori:Angeloni M, Moretti L, Mocella V, De Stefano L, Rotiroti L, Rea I, Dardano P, Bernstorff S/congresso_nome:International workshop on Nanostructured Materials/congresso_luogo:Antalya/congresso_data:2006/anno:2006/pagina_da:/pagina_a:/intervallo_pagine
Accession number :: edsair.cnr...........fec476f0b93bb0b9b2dff6d423b18411

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