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Quantitative analysis of charge-carrier trapping in organic thin-film transistors from transfer characteristics
- Source :
- International Conference on Organic Electronics 2009, pp. 55–60, Liverpool, 15-17/06/2009, info:cnr-pdr/source/autori:P. D'Angelo, F. Biscarini/congresso_nome:International Conference on Organic Electronics 2009/congresso_luogo:Liverpool/congresso_data:15-17%2F06%2F2009/anno:2009/pagina_da:55/pagina_a:60/intervallo_pagine:55–60
- Publication Year :
- 2009
-
Abstract
- This presentation deals with a modellization developed for describing OTFTs' instability upon bias stress effect through the analysis of hysteretic transfer characteristics
- Subjects :
- hysteresis
bias stress instability
pentacene OTFTs
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- International Conference on Organic Electronics 2009, pp. 55–60, Liverpool, 15-17/06/2009, info:cnr-pdr/source/autori:P. D'Angelo, F. Biscarini/congresso_nome:International Conference on Organic Electronics 2009/congresso_luogo:Liverpool/congresso_data:15-17%2F06%2F2009/anno:2009/pagina_da:55/pagina_a:60/intervallo_pagine:55–60
- Accession number :
- edsair.cnr...........30eead65cf4c2203a48a1216235f1420