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Small angle X-ray scattering and X-ray reflection on thin films
- Publication Year :
- 1997
-
Abstract
- Small angle X-ray scattering (SAXS) on thin films in standard sample orientation ( primary beam passes through the substrate before entering the film) yields a very weak signal due to unfavorable film to substrate thickness ratio.
- Subjects :
- SAXS
thin films
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Accession number :
- edsair.57a035e5b1ae..d34d8f14cb32b646718b94dc8f8ae560