scCVD Diamond Detector Spectroscopic Performance and Radiation Hardness Test

A high purity single crystal diamond produced by chemical vapor deposition (CVD) process recently became available as radiation detector device. Due to the excellent crystal quality and uniformity, these detectors show good energy resoluton and superior timing properties for charge particle detection. The ion beam induced charge (IBIC) is a very suitable ion microprobe technique for testing the charge collection properties of radiation detectors. With submicron spatial resolution of the ion microbeam, detector response can be studied at the microscopic level. In this work we report application of IBIC technique in characterization of commercial scCVD diamond detectors (1 mm2 area, 500 μ m thickness). Spatial distribution of charge collection efficiency (CCE) in diamond has been studied for different ions (protons, lithium and oxygen) and energies (1-10 MeV). Changes in energy resolution and polarization deterioration have also been studied in different working conditions and as a function of the ion energy, range and fluence. Preliminary results of radiation hardness measurements are also presented.