Structural Analysis of Intrinsic Defects in GaAs and AlxGa1—xAs by Magnetooptically Detected Magnetic Resonance Spectroscopy

MLA

Koschnick, F. K., and J. M. Spaeth. “Structural Analysis of Intrinsic Defects in GaAs and AlxGa1—xAs by Magnetooptically Detected Magnetic Resonance Spectroscopy.” Physica Status Solidi (B) - Basic Solid State Physics, vol. 216, no. 2, Dec. 1999, pp. 817–907. EBSCOhost, https://doi.org/10.1002/(SICI)1521-3951(199912)216:2<817::AID-PSSB817>3.0.CO;2-6.

APA

Koschnick, F. K., & Spaeth, J.-M. (1999). Structural Analysis of Intrinsic Defects in GaAs and AlxGa1—xAs by Magnetooptically Detected Magnetic Resonance Spectroscopy. Physica Status Solidi (B) - Basic Solid State Physics, 216(2), 817–907. https://doi.org/10.1002/(SICI)1521-3951(199912)216:2<817::AID-PSSB817>3.0.CO;2-6

Chicago

Koschnick, F.K., and J.-M. Spaeth. 1999. “Structural Analysis of Intrinsic Defects in GaAs and AlxGa1—xAs by Magnetooptically Detected Magnetic Resonance Spectroscopy.” Physica Status Solidi (B) - Basic Solid State Physics 216 (2): 817–907. doi:10.1002/(SICI)1521-3951(199912)216:2<817::AID-PSSB817>3.0.CO;2-6.